Nikon Metrology’s compact XT V 130 X-ray inspection system traces failures inside complex electronic devices and multilayer circuit boards. Hidden electronic defects arisen during production or assembly generally result in system failure, fabrication delay and additional cost. These defects can be detected efficiently early on in the process by taking an in-depth look at the inside of electronic specimens.

Designed for high-throughput electronics X-ray inspection, the XT V 130 is a  QA workhorse that allows operators to provide instant pass/fail status. Automated inspection functions and (optional) automatic board identification ensure high inspection throughput rates. Inspection reports compliant with MRP systems facilitate tight integration into customers’ manufacturing processes.

Today, any OEM and subsystem supplier of consumer, automotive, aerospace, medical and electronics can take advantage of X-ray inspection technology to get the job done!

The system comes with a 30-130kV open micro-focus X-ray source, a 4-axis programmable manipulator and a 16-bit imaging system based on a 4” image intensifier. A focal spot size down to 3 micron, 320x geometric magnification and tilt angle up to 60° offer excellent image quality and sufficient flexibility. A rotate stage and CT capability are available as option. A hinged door provides easy access to the inspection area, which fits samples up to 40x35cm (16x14”).

Using qualitative real-time X-ray capabilities, operators intuitively navigate through the layers of a PCB or inside electronic devices, by changing position, angle and zoom as desired using the joystick. The XT V 130 system is ideally suited to quickly trace material inconsistencies, connectivity issues, incomplete through-layer vias and other failures.

The intuitive operation of the compact XT V 130 system is controlled by Inspect-X, the powerful proprietary software used on all Nikon Metrology XT systems. Inspect-X is known for its powerful X-ray image processing and analysis as well as the broad set of automation capabilities that is included. Developed to streamline the inspection process with ultrafast Xray acquisition, the XT V 130 runs first-article inspection in minutes, instead of hours or days.

With a  footprint of just 1m2, a built-in generator and weight below 1150kg, the XT V 130 system easily fits any electronics production area without requiring high-voltage power or special floor conditions. The system’s protective enclosure puts safety first, avoiding the use of dedicated badges or protective
clothing.
www.nikonmetrology.com.